EU PVSEC Programme Online
EU PVSEC 2020, 7 - 11 September 2020

Dr. Yutaka Ohno

Tohoku University, Sendai, Japan

Dr. Yutaka Ohno (Ph.D.–physics) is focusing on quantitative analyses of the impurity segregation ability of grain boundaries in Si and compounds by APT combined with STEM and ab-initio calculations, but also on the study of atomistic structures of semiconductor nanostructures by optical measurements (CL, micro-PL, near-field optical measurements) under TEM.