EU PVSEC Programme Online
EU PVSEC 2020, 7 - 11 September 2020
Session: 4AV.1 Module Design Manufacture, Performance and Reliability (I)
Type: Visual
Date: Monday, 7th September 2020
13:30 - 15:00
Event: Conference Conference
Type(s) of Access:  Conference Registration
Topic: 4. Photovoltaic Modules and BoS Components
Presentations:
4AV.1.1 Repair Options for PV Modules with Cracked Polyamide Backsheets
G.C. Eder, OFI, Vienna, Austria
4AV.1.2 Investigating the Influence of Sample Configuration on EVA Degradation Modes
C. Barretta, PCCL, Leoben, Austria
4AV.1.3 Inorganic-Organic Hybrid Encapsulation of Flexible Cu(In,Ga)Se2 Mini-Modules
S.-T. Zhang, CNRS, Palaiseau, France
4AV.1.4 CdTe Module Degradation during Dry and Damp Accalerated Aging Tests in Respect to the Leakage Current Pathway
L. Gerstenberg, Nordhausen University of Applied Sciences, Nordhausen, Germany
4AV.1.5 Single-Step Fabrication of a Photovoltaic Module Using Encapsulants with Low Melting Temperature Metal Ribbons Embedded
D.-Y. Shin, Pukyong National University, Busan, Korea, Republic of
4AV.1.6 Delamination of c-Si Module Encapsulation: Insight into Causes and Long-Term Effects
A. Fairbrother, EPFL, Neuchâtel, Switzerland
4AV.1.7 Combined Approach for a Better Definition of Perovskite Devices Encapsulation Protocols and the Achievement of Targeted Lifetime in Standardized Conditions
S. Cros, CEA, Le Bourget-du-Lac, France
4AV.1.8 Encapsulant Selection for PID Resistant Modules Made with Heterojunction Solar Cells
O. Arriaga Arruti, EPFL, Neuchâtel, Switzerland
4AV.1.9 Degradation of Fielded PV Modules in Three Climates After Eight Years
D.S. Riley, Sandia National Laboratories, Albuquerque, USA
4AV.1.10 Development of Film-Based Ultra-Compact GaAs Photovoltaic Module Using Laser-Assisted Bonding
J. Joo, ETRI, Daejeon, Korea, Republic of
4AV.1.11 Reliability Evaluation of Photovoltaic Modules through Artificial Corrosion Test
S.-T. Hsu, ITRI, Hsinchu, Taiwan
4AV.1.12 Investigation of Discolored Electrodes of Crystalline Silicon PV Mini-Module Degraded by High Temperature and Humidity Stress Test
Y. Ino, AIST, Koriyama, Japan
4AV.1.14 Comparison of Long-Term Indoor and Outdoor Performance Measurement Techniques of Crystalline Silicon PV Modules to Validate Annual Degradation
F. Carigiet, ZHAW, Winterthur, Switzerland
4AV.1.15 Experimental Characterization of PV Solar Module Components - towards Numerical Modeling of the Lamination Process
I. Rahmoun, CEA, Le Bourget-du-Lac, France
4AV.1.16 Defect Investigation by ‘Coring’ for CIGS Solar Modules
P. Yilmaz, University of Twente, Enschede, Netherlands
4AV.1.17 High Refractive Index Encapsulants to Reduce Reflection Losses and Increase Cell Efficiencies in Crystalline Silicon PV
D. Mann, TNO, Eindhoven, Netherlands
4AV.1.18 Real Benefits from Conductive Backsheets for Back-Contacted Solar Modules
G.J.W. Meijers, DSM Advanced Solar, Geleen, Netherlands
4AV.1.19 Encapsulation Polymer Screening via Ultra-Fast Aging under High Irradiance UV LED
N. Pinochet, CEA, Le Bourget-du-Lac, France et al.
4AV.1.20 Studying the Impact of Infrared Spectrum on Submerged Amorphous, Mono-and Polycrystalline Solar Cells
P.K. Enaganti, BITS-Pilani, Hyderabad, India
4AV.1.21 Monitoring the Moisture Ingress into PV Modules by Measuring Capacitive Characteristics
E. Fokuhl, Fraunhofer ISE, Freiburg, Germany
4AV.1.23 LeTID and PID Hardness of Silicon Heterojunction Modules
S. Dimachkie, CEA, Le Bourget-du-Lac, France et al.
4AV.1.24 Analysis of Field Aged PV Modules with PET Based Backsheets Regarding Their Mechanical Stability
J. Schnepf, ZSW, Stuttgart, Germany
4AV.1.25 Home-Made UV-Fluorescence Spectroscopy Measurement Device for c-Si Photovoltaic Modules
J. Bengoechea, CENER, Sarriguren-Navarra, Spain
4AV.1.26 Measuring the Contact Resistivity of ECA-Based Joints
M.I. Devoto, ISC Konstanz, Constance, Germany
4AV.1.27 Correlation between EVA Degree of Crosslinking and Moisture Ingress into PV Laminates
D.E. Mansour, Fraunhofer ISE, Freiburg, Germany
4AV.1.29 PV Backsheet Failure Analysis by Scanning Acoustic Microscopy
D.E. Mansour, Fraunhofer ISE, Freiburg, Germany
4AV.1.30 Prediction of PID-s on the Basis of Accelerated Outdoor Module Testing and Weather Data
V. Naumann, Fraunhofer CSP, Halle (Saale), Germany
4AV.1.31 Potential-Induced Degradation of the Shunting Type: on the Origin of Sodium in Shunt Paths
R. Breugelmans, Hasselt University, Genk, Belgium
4AV.1.32 Mechanical Strength Analysis of the Si-Heterojunction Modules with Different Cells and Module Designs
K.V. Emtsev, R&D Center TFTE, St. Petersburg, Russian Federation
4AV.1.33 PID Leakage Current Modelling by Application of Machine Learning Techniques
D. Stellbogen, ZSW, Stuttgart, Germany
4AV.1.35 Characterization and Long Term Stability Analysis at Photovoltaic Modules with Shingled Cell Strings
S. Wendlandt, PI Berlin, Berlin, Germany
4AV.1.36 ATAMOSTEC Desert Label for PV Technologies
E. Urrejola, ATAMOSTEC, Antofagasta, Chile
4AV.1.37 Numerical Analysis on Cell Crack Initiation due to Thermomechanical Stresses
L. Papargyri, University of Cyprus, Nicosia, Cyprus
4AV.1.38 Sequential Module Testing: Results and Necessity Discussion
M. Pander, Fraunhofer CSP, Halle (Saale), Germany
4AV.1.40 Detection of Solar Cell Cracks by Laser Line Induced Lateral Currents and Luminescence Imaging
G.A. dos Reis Benatto, Technical University of Denmark, Roskilde, Denmark
4AV.1.41 Reliability Study of Three Cell Architectures and the Degradation Induced by Moisture Ingress
S.C. Pop, SCP SYS, San Francisco, USA
4AV.1.42 Failure Modes of Backsheets in Field and Laboratory Aged PV Modules
K.R. Choudhury, DuPont, Wilmington, USA
4AV.1.45 Accelerated LeTID Testing with Dark Current Voltage Characteristics Co-Measurement
B. Kubicek, AIT, Vienna, Austria
4AV.1.46 Extending Module Lifetime through Development of FEA Analysis Guidelines for Micro-Crack Prediction of Silicon Cells
Y. Yu, Canadian Solar, Suzhou, China
4AV.1.47 Backsheet Evaluation for Silicon Heterojunction Modules
K. Emtsev, R&D Center TFTE, St. Petersburg, Russian Federation
4AV.1.49 Durability of Polyolefin Encapsulation Based Modules: A Cross-Comparison of Commercially Available Solutions
B.X.J. Yu, Canadian Solar, Suzhou, China
4AV.1.50 Ultra-Fast Imaging of Third Generation Photovoltaics
R. Meitzner, Friedrich-Schiller-University Jena, Jena, Germany
4AV.1.51 70 Years UV Stability: by Aerobic Only Front EVA Weathering
F. Rummens, RENOLIT, Oudenaarde, Belgium
4AV.1.52 Performance Degradation Research of PV Module Installed in Different Climate Area
M.-W. Chen, TERTEC, Taoyuan, Taiwan