EU PVSEC Programme Online
EU PVSEC 2021, 6 - 10 September 2021
Presentation: 4AV.2.5 Potential Induced Degradation (PID) Free Module Design via Interruption of the Electric Field
Type: Visual
Date: Monday, 6th September 2021
17:00 - 18:30
Author(s): K. Sporleder, B. Jäckel, S. Schindler, S. Dittmann, R. Gottschalg
Presenter / Speaker: K. Sporleder, Fraunhofer IMWS, Halle (Saale), Germany
Event: Conference Conference
Session: 4AV.2 PV Module Characterisation, Testing and Outdoor Performance
Topic: 4. 1 PV Module Design, Manufacture, Performance and Reliability
Keywords: PV Module, PID, Degradation, Reliability
Summary / Abstract: Potential-Induced Degradation (PID) is a major reliability problem and can lead to significant power and energy yield losses and even total loss of the affected systems. If a PV module is operated under PID conditions, in short, if there is a high voltage drop between the solar cells installed in the module and the front glass, which is in contact with the grounded frame, PID may occur. Electric fields in the magnitude of MV/cm through the glass, encapsulation and the dielectric passivation layers of the solar cell cause a leakage current. Ions or electrons flow to the cell and can lead to severe degradation. PID is almost independent of the cell technology and affects different generations of solar cells. The approach presented here shields the dielectrics of the Si solar cell from electric fields and interrupts the leakage current. The proposed concept can be applied to different cell technologies.