EU PVSEC Programme Online
EU PVSEC 2020, 7 - 11 September 2020
Presentation: 3BV.1.33 Advanced Chemical Characterization of Perovskite Systems: XPS and GD-OES Coupling
Type: Visual
Date: Tuesday, 8th September 2020
08:30 - 10:00
Author(s): P. Dally, D. Messou, M. Robillard, A. Yaiche, J. Rousset, S. Béchu, M. Bouttemy
Presenter / Speaker: P. Dally, IPVF, Palaiseau, France
Event: Conference Conference
Session: 3BV.1 Perovskites
Type(s) of Access:  Conference Registration
Topic: 3. 1 Perovskites
Summary / Abstract: In order to enhance the device performances and stability, it is important to elaborate high-quality perovskite films by controlling their crystallinity, grain size, and morphology. Nevertheless, it is now known that the interfaces also play a fundamental role on the initial performances and stability [1]. Their chemical composition and structural defects are expected to affect critically the device electrical characteristics. To get further insight into the critical role of interfaces on device behavior, specific in-depth profiling methodology is developed to probe the chemical composition of the surface and the interface, based on a coupling between GD-OES and XPS analysis.