EU PVSEC Programme Online
EU PVSEC 2020, 7 - 11 September 2020
Presentation: 2AO.4.1 The Crystal Growth Explorer: Real-Time Navigable 3D Visualization of Silicon Grains and Defect Related Data in Cast-Mono and Multicrystalline Bricks
Type: Oral
Date: Monday, 7th September 2020
13:30 - 15:00
Author(s): J. Schönauer, M. Demant, T. Trötschler, A.S. Kovvali, H. Schremmer, P. Krenckel, S. Riepe, S. Rein
Presenter / Speaker: J. Schönauer, Fraunhofer ISE, Freiburg, Germany
Event: Conference Conference
Session: 2AO.4 Silicon Materials and Defect Engineering
Type(s) of Access:  Conference Registration
Topic: 2. 1 Feedstock, Crystallisation, Wafering, Defect Engineering
Keywords: Crystallization, Cast Mono, Characterisation, Characterization, Visualization, Grain
Summary / Abstract: Development of novel materials for silicon solar cell production like SMART mono material with functional grain boundaries depends on the human insight and understanding of the structural and dynamic properties of the underlying crystallization process. In this work, we present an analysis and visualization process that allows for comfortable, flexible human exploration and interpretation of various crystallization-related data types ranging from per-wafer photographic images and defect measurements to segmented and 3D-reconstructed grain and defect data, by putting and combining them in a concrete, meaningful, vivid visualization context close to the spatial structure of the actual grown crystal. We address two urgent challenges for smart mono development by combining appropriate data analysis and inspection methods: (1st) analyzing crystal growth characteristics for non-destructive quality inspection and (2nd) investigating defect scenarios for identifying the best crystallization recipes.