EU PVSEC Programme Online
EU PVSEC 2020, 7 - 11 September 2020
Presentation: 2CV.2.64 Investigation of the Temperature Dependence of the Optical Properties of Silicon Nitride Anti-Reflection Coating on Silicon Photovoltaic Modules
Type: Visual
Date: Wednesday, 11th September 2019
12:45 - 15:00
Location / Room: Marseille Chanot Convention and Exhibition Centre, Garden Level / Poster Area
Author(s): M.F. Zhang, R. Bhoopathy, A. Gentle, Z. Hameiri
Presenter / Speaker: R. Bhoopathy, UNSW Australia, Sydney, Australia
Event: Conference Conference
Session: 2CV.2 Feedstock, Crystallisation, Wafering, Defect Engineering/Thin Film and Foil-Based Si Solar Cells/Characterisation & Simulation o
Type(s) of Access:  Conference Registration
Topic: 2. 5 Characterisation & Simulation of Si Cells
Keywords: Silicon-Nitride, Antireflection Coating, Optical Properties, Characterisation, Characterization, PECVD
Summary / Abstract: This study investigates the possible existence of a temperature dependence of the optical properties of silicon nitride anti-reflection coatings commonly used in photovoltaic modules. Despite the crucial importance of silicon nitride optical properties to the module’s performance, they have so far not been studied under typical module operating temperatures, which are considerably higher than room temperature. Using a state-of-the-art temperature-dependent ellipsometry technique, we characterise a range of silicon nitride antireflection coatings under both room temperature and approximately 90°C, a temperature in the range of the upper limit of a module’s operating temperature found in practice. For the first time, we demonstrate that, within the spectral range of 300 nm to 2500 nm, anti-reflection coating silicon nitride is optically stable in the investigated temperature range.