EU PVSEC Programme Online
EU PVSEC 2020, 7 - 11 September 2020
Presentation: 2CV.2.7 Trapping in Multi-Crystalline Silicon Wafers: Impact of Laser Treatment and Firing
Type: Visual
Date: Wednesday, 11th September 2019
12:45 - 15:00
Location / Room: Marseille Chanot Convention and Exhibition Centre, Garden Level / Poster Area
Author(s): S. Jafari, Y. Zhu, F. Rougieux, Z. Hameiri
Presenter / Speaker: S. Jafari, UNSW Australia, Sydney, Australia
Event: Conference Conference
Session: 2CV.2 Feedstock, Crystallisation, Wafering, Defect Engineering/Thin Film and Foil-Based Si Solar Cells/Characterisation & Simulation o
Type(s) of Access:  Conference Registration
Topic: 2. 1 Feedstock, Crystallisation, Wafering, Defect Engineering
Summary / Abstract: Minority carrier traps in silicon affect photoconductance (PC)-based lifetime measurements at low and medium injection levels. In this study, the presence of minority carrier traps with a long PC decay time constant in multicrystalline silicon wafers is unraveled for the first time. To study these traps even further, the effect of firing and laser treatment on them is investigated. It is shown that firing introduces a metastable state of traps while laser treatment annihilates the trapping effect and seems to affect the trap’s concentration rather than its nature.